WebbChalmers Webb飞行时间二次离子质谱（tof-sims），也叫静态二次离子质谱，是飞行时间和二次离子质谱结合的一种新的表面分析技术。tof-sims具有高分辨、高灵敏度、精确质量测定等性 …

Applications of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

WebbStandard Ion Gun featuring FIB Function. The PHI nanoTOF 3 adds a FIB cross-sectioning function to the liquid metal ion gun. This allows small area cross-sectioning and TOF-SIMS analysis to be performed with a single ion gun. The entire process of cross-sectioning to analysis can be performed quickly and easily by computer operation. WebbTime of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a highly sensitive analytical technique that describes the chemical composition and distribution of a sample surface. … delta vs wye three phase

表面分析情報/表面分析トピックス/パラレルイメージングMS/MS …

WebbIn this work, a sulfidization mechanism of malachite was confirmed based on the depth profile product, principal component, and depth profile curve analyses of time-of-flight secondary ion mass spectrometry (TOF-SIMS). The results showed that Cu/S species, including fragment ion peaks of Cu2S+, Cu3S+, S−, HS−, S2−, CuS2−, and … WebbToF-SIMS analysis and a careful analytical sequence, good correlation between Wafer Thermal Desorption Gas Chromatography Mass Spectroscopy (W-TDGCMS) and ToF-SIMS results on wafers exposed for varying time under the clean-room air flow containing 2,2,4-trimethyl 1,3-pentanediol diisobutyrate (TXIB) and Phthalates – two main WebbWhile typical MS starts with gas phase molecules and ionises them, ToF-SIMS starts with a solid surface and pulls off ions. The Power of ToF-SIMS The technique only has a shallow probe depth of 1 − 2 n m and thus is only makes a mass spectrum of … delta vs united first class